Invention Grant
US08796398B2 Superfine pattern mask, method for production thereof, and method employing the same for forming superfine pattern
有权
超细纹图案掩模,其制造方法,以及使用其形成超细纹图案的方法
- Patent Title: Superfine pattern mask, method for production thereof, and method employing the same for forming superfine pattern
- Patent Title (中): 超细纹图案掩模,其制造方法,以及使用其形成超细纹图案的方法
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Application No.: US12978740Application Date: 2010-12-27
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Publication No.: US08796398B2Publication Date: 2014-08-05
- Inventor: Munirathna Padmanaban , Jin Li , Toru Koike , Yusuke Takano , Kazunori Kurosawa
- Applicant: Munirathna Padmanaban , Jin Li , Toru Koike , Yusuke Takano , Kazunori Kurosawa
- Applicant Address: US NJ Somerville
- Assignee: AZ Electronic Materials USA Corp.
- Current Assignee: AZ Electronic Materials USA Corp.
- Current Assignee Address: US NJ Somerville
- Agent Sangya Jain
- Main IPC: C08L83/16
- IPC: C08L83/16

Abstract:
There are provided a composition for forming a superfine pattern and a method employing the same for forming a superfine pattern. The composition enables to simply produce a superfine pattern with high mass productivity.The composition comprises perhydropolysilazane (I), silicon-containing polymer (II) having a hydrocarbon group, and a solvent. The mixture of those polymers contains silicon-hydrogen bonds and silicon-hydrocarbon group bonds in such amounts that the number of the silicon-hydrocarbon group bonds is in a ratio of 1 to 44% based on the total number of the silicon-hydrogen bonds and the silicon-hydrocarbon group bonds. The composition is applied on a resist pattern to form a spacer formed of the composition on the side wall of the ridges in the pattern, and then the spacer or a resin layer disposed around the spacer is used as a mask to form a superfine pattern.
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