Invention Grant
US08796589B2 Processing system with the dual end-effector handling 有权
具有双末端执行器处理的加工系统

Processing system with the dual end-effector handling
Abstract:
In a first aspect, a first substrate processing system is provided that includes (1) a chamber having a plurality of opening through which a substrate may be transported; (2) a substrate carrier opener coupled to a first one of the plurality of openings; (3) a thermal processing chamber coupled to a second one of the plurality of openings; and (4) a wafer handler contained within the chamber, having a substrate clamping blade and a blade adapted to transport high temperature substrates.
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