Invention Grant
- Patent Title: Method and apparatus for inspecting sealing defect of container
- Patent Title (中): 检查容器密封缺陷的方法和装置
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Application No.: US13511530Application Date: 2010-11-30
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Publication No.: US08796628B2Publication Date: 2014-08-05
- Inventor: Taichi Ijuin , Tomio Yamauchi , Akira Kawazoe , Tetsuya Takatomi
- Applicant: Taichi Ijuin , Tomio Yamauchi , Akira Kawazoe , Tetsuya Takatomi
- Applicant Address: JP Tokyo
- Assignee: Daiwa Can Company
- Current Assignee: Daiwa Can Company
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2009-276347 20091204
- International Application: PCT/JP2010/071307 WO 20101130
- International Announcement: WO2011/068090 WO 20110609
- Main IPC: G01N21/35
- IPC: G01N21/35 ; G01N21/3563 ; G01M3/38 ; G01N21/90

Abstract:
A method for inspecting sealing defects of a container using infrared light. Infrared light in a wavelength range of 1450 nm±20 nm is irradiated from a phototransmitter onto the sealed portion of a sample container Infrared light reflected from or transmitted through the sealed portion of the sample container is received by a photoreceiver, and transmitted to a photodetector through an optical fiber. The infrared light in a same wavelength range as the case of inspecting the sample container is irradiated onto the sealed portion of a container to be inspected. The infrared light reflected from or transmitted through the sealed portion of the inspected container is converted into the analog voltage value and transmitted to a controller. If the infrared light is reduced to be smaller than a threshold set on the basis of the sample container, the sealed portion of the inspected container is judged as a sealing defect.
Public/Granted literature
- US20120267534A1 METHOD AND APPARATUS FOR INSPECTING SEALING DEFECT OF CONTAINER Public/Granted day:2012-10-25
Information query
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