Invention Grant
- Patent Title: Beam-induced deposition at cryogenic temperatures
- Patent Title (中): 在低温下的光束沉积
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Application No.: US13172596Application Date: 2011-06-29
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Publication No.: US08796646B2Publication Date: 2014-08-05
- Inventor: Johannes Jacobus Lambertus Mulders , Petrus Hubertus Franciscus Trompenaars
- Applicant: Johannes Jacobus Lambertus Mulders , Petrus Hubertus Franciscus Trompenaars
- Applicant Address: US OR Hillsboro
- Assignee: Fei Company
- Current Assignee: Fei Company
- Current Assignee Address: US OR Hillsboro
- Agency: Scheinberg & Associates, PC
- Agent Michael O. Scheinberg
- Priority: EP10167905 20100630
- Main IPC: H01J37/30
- IPC: H01J37/30

Abstract:
A method of depositing material onto a substrate at cryogenic temperatures using beam-induced deposition. A precursor gas is chosen from a group of compounds having a melting point that is lower than the cryogenic temperature of the substrate. Preferably the precursor gas is chosen from a group of compounds having a sticking coefficient that is between 0.5 and 0.8 at the desired cryogenic temperature. This will result in the precursor gas reaching equilibrium between precursor molecules adsorbed onto the substrate surface and precursor gas molecules desorbing from the substrate surface at the desired cryogenic temperature. Suitable precursor gases can comprise alkanes, alkenes, or alkynes. At a cryogenic temperature of between −50° C. and −85° C., hexane can be used as a precursor gas to deposit material; at a cryogenic temperature of between −50° C. and −180° C., propane can be used as a precursor gas.
Public/Granted literature
- US20120003394A1 Beam-Induced Deposition at Cryogenic Temperatures Public/Granted day:2012-01-05
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