Invention Grant
- Patent Title: N well implants to separate blocks in a flash memory device
- Patent Title (中): N阱注入在闪存设备中分离块
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Application No.: US13901088Application Date: 2013-05-23
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Publication No.: US08796818B2Publication Date: 2014-08-05
- Inventor: Frankie F. Roohparvar
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Dicke, Billig & Czaja, PLLC
- Main IPC: H01L21/70
- IPC: H01L21/70

Abstract:
A semiconductor memory device that has an isolated area formed from one conductivity and formed in part by a buried layer of a second conductivity that is implanted in a substrate. The walls of the isolated area are formed by implants that are formed from the second conductivity and extend down to the buried layer. The isolated region has implanted source lines and is further subdivided by overlay strips of the second conductivity that extend substantially down to the buried layer. Each isolation region can contain one or more blocks of memory cells.
Public/Granted literature
- US20130256831A1 N WELL IMPLANTS TO SEPARATE BLOCKS IN A FLASH MEMORY DEVICE Public/Granted day:2013-10-03
Information query
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