Invention Grant
US08797514B2 Localized dynamic light scattering system with doppler velocity measuring capability 有权
具有多普勒速度测量能力的局部动态光散射系统

  • Patent Title: Localized dynamic light scattering system with doppler velocity measuring capability
  • Patent Title (中): 具有多普勒速度测量能力的局部动态光散射系统
  • Application No.: US13674110
    Application Date: 2012-11-12
  • Publication No.: US08797514B2
    Publication Date: 2014-08-05
  • Inventor: Lidek Chou
  • Applicant: Lidek Chou
  • Applicant Address: US CA Pleasanton
  • Assignee: Lidek Chou
  • Current Assignee: Lidek Chou
  • Current Assignee Address: US CA Pleasanton
  • Main IPC: G01P3/36
  • IPC: G01P3/36 G01N15/02 G01N21/49
Localized dynamic light scattering system with doppler velocity measuring capability
Abstract:
A localized dynamic light scattering measurement system includes a beam displacer for splitting an incident beam having two orthogonal linearly polarized beam components with slightly different frequencies into two orthogonal linearly polarized output beams focused onto an object to be measured. The beam displacer cooperates with an iris to collect and recombine scattering beams each reversely backscattered at 180 degrees from the object so as to form a signal beam, which is polarized by a polarizer to produce two polarization components, thereby generating a heterodyne interference signal associated with the polarization components. A signal processing unit obtains measurement data on the object based on power spectrum or autocorrelation data corresponding to the heterodyne interference signal.
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