Invention Grant
US08797529B2 Spectrometer design for aberration correction, simplified manufacture, and compact footprint
有权
光谱仪设计用于像差校正，简化制造和紧凑的占地面积
- Patent Title: Spectrometer design for aberration correction, simplified manufacture, and compact footprint
- Patent Title (中): 光谱仪设计用于像差校正，简化制造和紧凑的占地面积
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Application No.: US13355543Application Date: 2012-01-22
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Publication No.: US08797529B2Publication Date: 2014-08-05
- Inventor: David R. Demmer , Thomas L. Haslett , Joseph L. Dallas
- Applicant: David R. Demmer , Thomas L. Haslett , Joseph L. Dallas
- Applicant Address: US FL Dunedin
- Assignee: Ocean Optics, Inc.
- Current Assignee: Ocean Optics, Inc.
- Current Assignee Address: US FL Dunedin
- Agent Dennis L. Cook, Esq.
- Main IPC: G01J3/28
- IPC: G01J3/28 ; G02B26/02 ; G01J3/04 ; G01J3/02 ; G01J3/18
Abstract:
A spectrometer design method that corrects aberration by using crossed optical paths and minor alignment, simplifies manufacture by applying the light entrance slit and aperture on opposite sides of a transparent input block, and creates a more compact footprint by placing a 45 degree mirror or right angle prism directly in front of the detector is disclosed.
Public/Granted literature
- US20120188541A1 NOVEL SPECTROMETER DESIGN FOR ABERRATION CORRECTION, SIMPLIFIED MANUFACTURE, AND COMPACT FOOTPRINT Public/Granted day:2012-07-26
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