Invention Grant
- Patent Title: System and method for polarization measurement
- Patent Title (中): 用于偏振测量的系统和方法
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Application No.: US13636983Application Date: 2011-03-24
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Publication No.: US08797532B2Publication Date: 2014-08-05
- Inventor: Nir Davidson , Asher Friesem , Moti Fridman
- Applicant: Nir Davidson , Asher Friesem , Moti Fridman
- Applicant Address: IL Rehovot
- Assignee: Yeda Research and Development Company Ltd.
- Current Assignee: Yeda Research and Development Company Ltd.
- Current Assignee Address: IL Rehovot
- Agency: Browdy and Neimark, PLLC
- International Application: PCT/IL2011/000275 WO 20110324
- International Announcement: WO2011/117873 WO 20110929
- Main IPC: G01J4/00
- IPC: G01J4/00

Abstract:
Measuring polarization profile along an input optical beam cross-section using an optical system includes a polarization beam splitting assembly for splitting the input beam into a predetermined number of beam components with a predetermined polarization relation between them, and including a polarization beam splitter in an optical path of the input beam splitting it into beam components having a polarization relationship and a birefringent element in an optical path of the beam components for splitting each of them into a pair of beams having ordinary and extraordinary polarizations, thereby producing the predetermined number of output beam components. The pixel matrix is located in substantially non-intersecting optical paths of the output beam components and generates a number of output data pieces indicative of intensity distribution within the output beam components and data contained therein being indicative of the polarization profile along the input beam cross-section.
Public/Granted literature
- US20130010295A1 SYSTEM AND METHOD FOR POLARIZATION MEASUREMENT Public/Granted day:2013-01-10
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