Invention Grant
- Patent Title: Electronic load for testing voltage stability
- Patent Title (中): 用于测试电压稳定性的电子负载
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Application No.: US13541662Application Date: 2012-07-04
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Publication No.: US08797701B2Publication Date: 2014-08-05
- Inventor: Qi-Long Yu , Tsung-Jen Chuang , Jun Zhang , Jun-Wei Zhang
- Applicant: Qi-Long Yu , Tsung-Jen Chuang , Jun Zhang , Jun-Wei Zhang
- Applicant Address: CN Shenzhen TW New Taipei
- Assignee: Fu Tai Hua Industry (Shenzhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Fu Tai Hua Industry (Shenzhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: CN Shenzhen TW New Taipei
- Agency: Novak Druce Connolly Bove + Quigg LLP
- Priority: CN201210149567 20120515
- Main IPC: H02H7/00
- IPC: H02H7/00

Abstract:
An electronic load for testing stability of a power voltage of a power source under test (PSUT) includes a voltage supply device, a field effect transistor (FET), an amplification circuit, and a current sampling resistor. The amplification circuit includes a first input, a second input, and an output. The voltage supply device is connected to the first input. The second input is connected to a source electrode of the FET. The output is connected to a gate electrode of the FET. A drain electrode of the FET is connected to the PSUT. One end of the current sampling resistor is grounded, and the other end of the current sampling resistor is connected to the source electrode of the FET and the second input. The voltage supply device outputs a control voltage. The amplification circuit amplifies the control voltage and drives the FET using the amplified control voltage.
Public/Granted literature
- US20130308240A1 ELECTRONIC LOAD FOR TESTING VOLTAGE STABILITY Public/Granted day:2013-11-21
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