A measuring device for the efficient storage of test values and associated addresses provides a first storage region (30) and a second storage region (33). The first storage region (30) comprises a first number of memory cells (32) of a first cell size (31). The second storage region (33) comprises a second number of memory cells (35) of a second cell size (34). The measuring device further provides a third storage region (36) made from a second number of memory cells (38). A memory cell (38) of the third storage region (36) is rigidly assigned to each memory cell (35) of the second storage region (33). A control unit stores test values in the storage regions in a cumulative manner, separated according to addresses, for storing the test values only in the first storage region, if the test value for the respective address does not exceed the first cell size, for storing test values which exceed the first cell size jointly in memory cells of the first storage region and memory cells of the third storage region, and for storing associated addresses of the test values which exceed the first cell size in the corresponding memory cells of the second storage region.