Invention Grant
- Patent Title: Systems and methods for performing measurements of one or more materials
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Application No.: US13621929Application Date: 2012-09-18
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Publication No.: US08798951B2Publication Date: 2014-08-05
- Inventor: Wayne D. Roth , Charles J. Collins , Nicolas F. Arab , Donald A. Conner , Robert S. Roach , David L. Smith
- Applicant: Luminex Corporation
- Applicant Address: US TX Austin
- Assignee: Luminex Corporation
- Current Assignee: Luminex Corporation
- Current Assignee Address: US TX Austin
- Agency: Parker Highlander PLLC
- Main IPC: G01D18/00
- IPC: G01D18/00 ; G01N21/00 ; G01N35/08 ; G01N35/00

Abstract:
Systems and methods for performing measurements of one or more materials are provided. One system is configured to transfer one or more materials to an imaging volume of a measurement device from one or more storage vessels. Another system is configured to image one or more materials in an imaging volume of a measurement device. An additional system is configured to substantially immobilize one or more materials in an imaging volume of a measurement device. A further system is configured to transfer one or more materials to an imaging volume of a measurement device from one or more storage vessels, to image the one or more materials in the imaging volume, to substantially immobilize the one or more materials in the imaging volume, or some combination thereof.
Public/Granted literature
- US20130022502A1 Systems and Methods for Performing Measurements of One or More Materials Public/Granted day:2013-01-24
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