Invention Grant
- Patent Title: Circuit simulation using step response analysis in the frequency domain
- Patent Title (中): 电路仿真使用频域中的阶跃响应分析
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Application No.: US12143895Application Date: 2008-06-23
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Publication No.: US08798981B2Publication Date: 2014-08-05
- Inventor: Choshu Ito , William Loh
- Applicant: Choshu Ito , William Loh
- Applicant Address: US CA San Jose
- Assignee: LSI Corporation
- Current Assignee: LSI Corporation
- Current Assignee Address: US CA San Jose
- Agency: Otterstedt, Ellenbogen & Kammer, LLP
- Main IPC: G06G7/56
- IPC: G06G7/56 ; G06F17/50

Abstract:
A method for simulating a response of a circuit to an ESD input stimulus applied to the circuit includes the steps of: receiving a description of the circuit into a circuit simulation program, the circuit including at least one mutual inductance element indicative of magnetic coupling in the circuit; generating a linear approximation of nonlinear elements in the circuit at respective DC bias points of the nonlinear elements; obtaining a frequency domain transfer function of the circuit; obtaining a time domain impulse response of the circuit as a function of the frequency domain transfer function; integrating the time domain impulse response to yield a step response of the circuit, the step response being indicative of a response of the circuit to the ESD input stimulus; and analyzing the step response of the circuit to determine whether the circuit will operate within prescribed parameters corresponding to the circuit.
Public/Granted literature
- US20090319251A1 Circuit Simulation Using Step Response Analysis in the Frequency Domain Public/Granted day:2009-12-24
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