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US08799684B2 Apparatus, method and process to determine a threshold voltage so that leakage power of a plurality of transistors is inversely proportional to a plurality of processor cores 有权
确定阈值电压的装置，方法和过程，使得多个晶体管的泄漏功率与多个处理器核心成反比

  • Patent Title: Apparatus, method and process to determine a threshold voltage so that leakage power of a plurality of transistors is inversely proportional to a plurality of processor cores
  • Patent Title (中): 确定阈值电压的装置，方法和过程，使得多个晶体管的泄漏功率与多个处理器核心成反比
  • Application No.: US12562738
    Application Date: 2009-09-18
  • Publication No.: US08799684B2
    Publication Date: 2014-08-05
  • Inventor: Keisuke Muraya
  • Applicant: Keisuke Muraya
  • Applicant Address: JP Kawasaki
  • Assignee: Fujitsu Limited
  • Current Assignee: Fujitsu Limited
  • Current Assignee Address: JP Kawasaki
  • Agency: Staas & Halsey LLP
  • Main IPC: G06F1/00
  • IPC: G06F1/00 ;  G06F17/50
Apparatus, method and process to determine a threshold voltage so that leakage power of a plurality of transistors is inversely proportional to a plurality of processor cores
Abstract:
An information processing device includes a plurality of processor cores each including a plurality of transistors, and at least one substrate bias circuit that supplies each of the plurality of transistors with a substrate bias voltage that is determined based on the number of the processor cores.
Abstract(Chinese):

一种信息处理设备包括多个处理器核心，每个处理器核心均包括多个晶体管，以及至少一个衬底偏置电路，其为所述多个晶体管中的每个晶体管提供基于所述处理器核心数确定的衬底偏置电压。

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