A method for correcting faults in semiconductor memory components provides an application system having a multichip module (1) which has a semiconductor memory component (2) containing a volatile memory and a diverting circuit (7). When the application system is being booted up, addresses of faulty memory cells in the semiconductor memory component (2) are loaded into the multichip module (1), with the result that the diverting circuit (7) diverts access to a memory cell in the replacement data memory if a faulty memory cell in the semiconductor memory component (2) is accessed.