Invention Grant
US08799753B2 Trace/failure observation system, trace/failure observation method, and trace/failure observation program
有权
跟踪/故障观察系统,跟踪/故障观察方法和跟踪/故障观察程序
- Patent Title: Trace/failure observation system, trace/failure observation method, and trace/failure observation program
- Patent Title (中): 跟踪/故障观察系统,跟踪/故障观察方法和跟踪/故障观察程序
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Application No.: US12863934Application Date: 2009-02-03
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Publication No.: US08799753B2Publication Date: 2014-08-05
- Inventor: Noriaki Suzuki , Junji Sakai
- Applicant: Noriaki Suzuki , Junji Sakai
- Applicant Address: JP Tokyo
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2008-023780 20080204
- International Application: PCT/JP2009/051752 WO 20090203
- International Announcement: WO2009/099045 WO 20090813
- Main IPC: G06F7/02
- IPC: G06F7/02 ; G06F11/00 ; G06F11/36

Abstract:
There is provided a trace/failure observation system which is capable of comprehensive collection of information that is needed for checking a desired operation in a system or the like where the amount of information to be observed is large, and which allows easy analysis of the desired operation. The system includes, in a system LSI to be subjected to trace/failure observation: an event detecting means for observing behavior of a portion to be observed; a first data reducing means for performing observation data reduction processing so that observation data from the event detecting means has an amount of information processable to a second data reducing means; and the second data reducing means for performing one or more steps of observation data reduction processing.
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