Invention Grant
- Patent Title: Precise critical temperature indicator and manufacturing method therefor
- Patent Title (中): 精确临界温度指示器及其制造方法
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Application No.: US13125802Application Date: 2009-10-21
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Publication No.: US08800472B2Publication Date: 2014-08-12
- Inventor: Ji Hoon Park
- Applicant: Ji Hoon Park
- Applicant Address: KR Seoul
- Assignee: Intellectual Discovery, Inc.
- Current Assignee: Intellectual Discovery, Inc.
- Current Assignee Address: KR Seoul
- Agency: Rothwell, Figg, Ernst & Manbeck, P.C.
- Priority: KR10-2008-0104758 20081024; KR10-2009-0065770 20090720
- International Application: PCT/KR2009/006088 WO 20091021
- International Announcement: WO2010/047527 WO 20100429
- Main IPC: G01K11/12
- IPC: G01K11/12 ; G01K3/04

Abstract:
A precise critical temperature indicator is applied to small products requiring refrigeration or freezing to control the operation of a temperature sensor built into an integrated structure of a single body. A method for manufacturing said precise critical temperature indicator, wherein a plurality of development medium members and a plurality of development material members are opposed to each other, and blocking members are interposed therebetween to support the development medium members and the development material members separately from each other, the development medium members are provided with paths for moving development materials, or paths for movement of development materials can be shortened to adjust speed, and an indication unit is arranged to indicate the state of the development materials at an end or central portion of the development medium when the development materials are exposed to a critical temperature for a predetermined time period.
Public/Granted literature
- US20110214602A1 Precise Critical Temperature Indicator and Manufacturing Method Therefor Public/Granted day:2011-09-08
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