Invention Grant
- Patent Title: Die attach stress isolation
- Patent Title (中): 芯片附着应力隔离
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Application No.: US13351482Application Date: 2012-01-17
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Publication No.: US08803262B2Publication Date: 2014-08-12
- Inventor: Marcus A. Childress , Nghia T. Dinh , James C. Golden
- Applicant: Marcus A. Childress , Nghia T. Dinh , James C. Golden
- Applicant Address: US MN Burnsville
- Assignee: Rosemount Aerospace Inc.
- Current Assignee: Rosemount Aerospace Inc.
- Current Assignee Address: US MN Burnsville
- Agency: Edwards Wildman Palmer LLP
- Agent Scott D. Wofsy; Joshua L. Jones
- Main IPC: G01P15/08
- IPC: G01P15/08

Abstract:
A microstructure device package includes a package housing configured and adapted to house a microstructure device. A bracket is housed in the package housing. The bracket includes a bracket base with a first bracket arm and a second bracket arm each extending from the bracket base. A channel is defined between the first and second bracket arms. The first bracket aim defines a first mounting surface facing inward with respect to the channel. The second bracket aim defines a second mounting surface facing outward with respect to the channel. The second mounting surface of the bracket is mounted to the package housing. A microstructure device is mounted to the first mounting surface in the channel. The bracket is configured and adapted to isolate the microstructure device from packaging stress imparted from the package housing on the second mounting surface of the bracket.
Public/Granted literature
- US20130181303A1 DIE ATTACH STRESS ISOLATION Public/Granted day:2013-07-18
Information query
IPC分类: