Invention Grant
US08803516B2 Eddy current testing method and apparatus for inspecting an object for flaws
有权
用于检查物体的涡流检测方法和装置的缺陷
- Patent Title: Eddy current testing method and apparatus for inspecting an object for flaws
- Patent Title (中): 用于检查物体的涡流检测方法和装置的缺陷
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Application No.: US13140845Application Date: 2009-12-14
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Publication No.: US08803516B2Publication Date: 2014-08-12
- Inventor: Takashi Hibino , Takashi Fujimoto , Keisuke Komatsu , Yoshiyuki Nakao , Makoto Takata , Makoto Sakamoto
- Applicant: Takashi Hibino , Takashi Fujimoto , Keisuke Komatsu , Yoshiyuki Nakao , Makoto Takata , Makoto Sakamoto
- Applicant Address: JP Tokyo
- Assignee: Nippon Steel & Sumitomo Metal Corporation
- Current Assignee: Nippon Steel & Sumitomo Metal Corporation
- Current Assignee Address: JP Tokyo
- Agency: Clark & Brody
- Priority: JP2008-328867 20081224
- International Application: PCT/JP2009/070813 WO 20091214
- International Announcement: WO2010/073926 WO 20100701
- Main IPC: G01R33/12
- IPC: G01R33/12 ; G01N27/90 ; G01N27/82

Abstract:
In an eddy current testing method which involves using a rotatable eddy current testing probe in which a detection coil is arranged within an exciting coil, a change in detection sensitivity (a deviation of detection sensitivity) which changes depending on the rotational position of the detection coil is reduced. The eddy current testing probe includes an exciting coil EC1, a detection coil DC1, an exciting coil EC2 and a detection coil DC2, which are mounted on a disk DS. The eddy current testing probe is placed so as to face a circumferential surface of an object to be inspected T, which is in the shape of a circular cylinder, and the disk DS is rotated. Then, the distance (liftoff) between the detection coils DC1 and DC2 and an inspection surface changes. Therefore, also the detection sensitivity to a flaw signal changes. To reduce the change in detection sensitivity, the detection sensitivity is adjusted by detecting the rotational position (rotational angle) of the detection coils DC1 and DC2.
Public/Granted literature
- US20120161758A1 EDDY CURRENT TESTING METHOD AND EDDY CURRENT TESTING APPARATUS Public/Granted day:2012-06-28
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