Invention Grant
- Patent Title: Magnetic-field analyzing apparatus and magnetic-field analyzing program
- Patent Title (中): 磁场分析装置和磁场分析程序
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Application No.: US12801604Application Date: 2010-06-16
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Publication No.: US08803517B2Publication Date: 2014-08-12
- Inventor: Koichi Shimizu
- Applicant: Koichi Shimizu
- Applicant Address: JP Kawasaki
- Assignee: Fujitsu Limited
- Current Assignee: Fujitsu Limited
- Current Assignee Address: JP Kawasaki
- Agency: Staas & Halsey LLP
- Priority: JP2009-148993 20090623
- Main IPC: G01R33/02
- IPC: G01R33/02
Abstract:
A first equation is created, using the physical property data of a user-specified target to be analyzed, to calculate a first magnetic field due to a current vector in the target to be analyzed in such a manner that a finite element method and a boundary integral method are applicable to the first equation. A second equation is created, using the physical property data of the user-specified target to be analyzed, to calculate a second magnetic field due to a magnetization vector in the target to be analyzed in such a manner that the finite element method and the boundary integral method are applicable to the second equation. A first magnetic field and a second magnetic field are calculated using the first equation and the second equation, respectively. The sum of the first magnetic field and the second magnetic field is set to the magnetic field of the target.
Public/Granted literature
- US20100321013A1 Magnetic-field analyzing apparatus and magnetic-field analyzing program Public/Granted day:2010-12-23
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