Invention Grant
- Patent Title: Method and system of adjusting a field of view of an interferometric imaging device
- Patent Title (中): 调整干涉测量成像装置的视野的方法和系统
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Application No.: US12816394Application Date: 2010-06-16
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Publication No.: US08804133B2Publication Date: 2014-08-12
- Inventor: Dvir Yelin , Michal Merman
- Applicant: Dvir Yelin , Michal Merman
- Applicant Address: IL Haifa
- Assignee: Technion Research & Development Foundation Limited
- Current Assignee: Technion Research & Development Foundation Limited
- Current Assignee Address: IL Haifa
- Main IPC: G01B9/02
- IPC: G01B9/02

Abstract:
A method of imaging at least a part of an object. The method comprises splitting electro-magnetic radiation to first and second portions, propagating the first and second portions, spectrally dispersing the first portion toward the part and the second portion toward a reference element, combining between reflections of the spectrally dispersed first and second portions to produce an interference signal, capturing an image of the part from the interference, and adjusting at least one of a tilt of said image plane and a curvature of the image by changing a deviation between the phase of at least one spectral component of the first portion and the phase of at least one spectral component of the second portion.
Public/Granted literature
- US20100315652A1 METHOD AND SYSTEM OF ADJUSTING A FIELD OF VIEW OF AN INTERFEROMETRIC IMAGING DEVICE Public/Granted day:2010-12-16
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