Invention Grant
- Patent Title: Signal quality measuring apparatus and method thereof
- Patent Title (中): 信号质量测量装置及其方法
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Application No.: US12726374Application Date: 2010-03-18
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Publication No.: US08804799B2Publication Date: 2014-08-12
- Inventor: Hyun-soo Park , Kyung-geun Lee , In-oh Hwang , Hui Zhao , Jong-hyun Shin
- Applicant: Hyun-soo Park , Kyung-geun Lee , In-oh Hwang , Hui Zhao , Jong-hyun Shin
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: NSIP Law
- Priority: KR10-2009-0106666 20091105
- Main IPC: H04B17/00
- IPC: H04B17/00

Abstract:
A signal quality measuring apparatus includes a binary signal generating unit to generate a binary signal from an input signal; a level information extracting unit to extract level information from a relationship between the input signal and the binary signal using at least two window lengths; and a quality calculating unit to calculate a quality of the input signal based on the level information.
Public/Granted literature
- US20100238989A1 SIGNAL QUALITY MEASURING APPARATUS AND METHOD THEREOF Public/Granted day:2010-09-23
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