Invention Grant
- Patent Title: Electronic device and method for measuring point cloud of object
- Patent Title (中): 用于测量物体点云的电子装置和方法
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Application No.: US13648266Application Date: 2012-10-09
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Publication No.: US08805015B2Publication Date: 2014-08-12
- Inventor: Chih-Kuang Chang , Xin-Yuan Wu , Yi Liu
- Applicant: Chih-Kuang Chang , Xin-Yuan Wu , Yi Liu
- Applicant Address: CN Shenzhen TW New Taipei
- Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: CN Shenzhen TW New Taipei
- Agency: Novak Druce Connolly Bove + Quigg LLP
- Priority: CN201210079307 20120323
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
A method obtains an original point-cloud of the object, filters discrete points from the original point-cloud, determines a first sub-point-cloud and a second sub-point-cloud from the filtered point-cloud, and creates an updated point-cloud of the object based on the first sub-point-cloud and the second sub-point-cloud, determines points to be fitted from the updated point-cloud. The method further fits a figure according to the determined points, determines a reference figure according to the fitted figure, determines a first point from the first sub-point-cloud and a second point from the second-point-cloud, calculates a gap width and a gap height of the updated point-cloud according to the first determined point, the second determined point, and the reference figure, and displays the gap width and the gap height on a display device.
Public/Granted literature
- US20130251195A1 ELECTRONIC DEVICE AND METHOD FOR MEASURING POINT CLOUD OF OBJECT Public/Granted day:2013-09-26
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