Invention Grant
- Patent Title: Dynamic instrumentation method and apparatus for tracing and analyzing a program
- Patent Title (中): 用于跟踪和分析程序的动态仪表方法和装置
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Application No.: US13117809Application Date: 2011-05-27
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Publication No.: US08806448B2Publication Date: 2014-08-12
- Inventor: Jae-Hoon Jeong
- Applicant: Jae-Hoon Jeong
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: NSIP Law
- Priority: KR10-2010-0083556 20100827
- Main IPC: G06F9/45
- IPC: G06F9/45

Abstract:
An apparatus and method for dynamically analyzing a program are provided. The apparatus and method help minimize overhead in tracing the execution of the program without substantially affecting the operation of the program at run time. The method includes storing an environment value before execution of a function of a main page by storing a first instruction of the function in a temporary page before execution of the first instruction. The method also includes inserting a break instruction at an address of the first instruction in the main page, executing the break instruction, and storing an environment value after execution of the function by executing a break instruction of the temporary page.
Public/Granted literature
- US20120054723A1 DYNAMIC INSTRUMENTATION METHOD AND APPARATUS THEREOF Public/Granted day:2012-03-01
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