Invention Grant
- Patent Title: Planar coil arrangement for a magnetic induction impedance measurement apparatus
- Patent Title (中): 用于磁感应阻抗测量装置的平面线圈布置
-
Application No.: US13981624Application Date: 2012-02-01
-
Publication No.: US08808190B2Publication Date: 2014-08-19
- Inventor: Francisco Javier Rosell Ferrer , Claudia Hannelore Igney , Matthias Hamsch
- Applicant: Francisco Javier Rosell Ferrer , Claudia Hannelore Igney , Matthias Hamsch
- Applicant Address: NL Eindhoven
- Assignee: Koninklijke Philips N.V.
- Current Assignee: Koninklijke Philips N.V.
- Current Assignee Address: NL Eindhoven
- Priority: EP11153167 20110203
- International Application: PCT/IB2012/050469 WO 20120201
- International Announcement: WO2012/104799 WO 20120809
- Main IPC: A61B5/02
- IPC: A61B5/02

Abstract:
A planar coil arrangement (400) for a magnetic induction impedance measurement apparatus comprises an excitation coil (102) configured for generating a magnetic excitation field in an object, and a detection coil (404) configured for detecting a magnetic response field generated in response to the magnetic excitation field inducing a current in the object. In order to minimize an effect of the magnetic excitation field in the detection coil (404), the detection coil (404) is radially symmetrical shaped with respect to the excitation coil (102) and is arranged relative to the excitation coil (102) such that the magnetic excitation field is minimized in the detection coil (404).
Public/Granted literature
- US20130303924A1 PLANAR COIL ARRANGEMENT FOR A MAGNETIC INDUCTION IMPEDANCE MEASUREMENT APPARATUS Public/Granted day:2013-11-14
Information query