Invention Grant
US08809200B2 Method of manufacturing a structure based on anisotropic etching, and silicon substrate with etching mask
有权
基于各向异性蚀刻的结构的制造方法和具有蚀刻掩模的硅衬底
- Patent Title: Method of manufacturing a structure based on anisotropic etching, and silicon substrate with etching mask
- Patent Title (中): 基于各向异性蚀刻的结构的制造方法和具有蚀刻掩模的硅衬底
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Application No.: US12271993Application Date: 2008-11-17
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Publication No.: US08809200B2Publication Date: 2014-08-19
- Inventor: Kazutoshi Torashima , Takahisa Kato , Takahiro Akiyama
- Applicant: Kazutoshi Torashima , Takahisa Kato , Takahiro Akiyama
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Fitzpatrick, Cella, Harper & Scinto
- Priority: JP2007-298175 20071116
- Main IPC: H01L21/302
- IPC: H01L21/302 ; H01L21/461 ; B81C1/00 ; H01L21/308

Abstract:
A method of manufacturing a structure includes a first step of forming, on a monocrystal silicon substrate having a (100) surface as a principal surface, a basic etching mask corresponding to a target shape and having at least a first structure with a projecting corner and a second structure adjoining the first structure with an opening intervening therebetween, and a correction etching mask extending from the projecting corner of an etching mask of the first structure and connected to an etching mask of the second structure, and a second step of performing anisotropic etching of the monocrystal silicon substrate having the basic etching mask and the correction etching mask to form the target shape.
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