Invention Grant
- Patent Title: System and method for pixelated detector calibration
- Patent Title (中): 用于像素化检测器校准的系统和方法
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Application No.: US13360381Application Date: 2012-01-27
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Publication No.: US08809793B2Publication Date: 2014-08-19
- Inventor: Ashwin Ashok Wagadarikar , Ravindra Mohan Manjeshwar , Sergei Ivanovich Dolinsky
- Applicant: Ashwin Ashok Wagadarikar , Ravindra Mohan Manjeshwar , Sergei Ivanovich Dolinsky
- Applicant Address: US NY Niskayuna
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Niskayuna
- Agency: Fletcher Yoder, P.C.
- Main IPC: G01T1/166
- IPC: G01T1/166

Abstract:
Present embodiments relate to the calibration of detectors having one or more arrays of pixelated detectors. According to an embodiment, a method includes detecting optical outputs generated by a plurality of scintillation crystals of a detector with an array of pixelated detectors, generating, with the array of pixelated detectors, respective signals indicative of the optical outputs, generating, from the respective signals, a unique energy spectrum correlated to each of the plurality of scintillation crystals, grouping subsets of the plurality of scintillation crystals into macrocrystals, determining a representative energy spectrum peak for each macrocrystal based on the respective energy spectra of the scintillation crystals in the macrocrystal, comparing a value of the representative energy spectrum peak for each macrocrystal with a target peak value, and adjusting an operating parameter of at least one pixelated detector in the array of pixelated detectors as a result of the comparison.
Public/Granted literature
- US20130193330A1 SYSTEM AND METHOD FOR PIXELATED DETECTOR CALIBRATION Public/Granted day:2013-08-01
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