Invention Grant
- Patent Title: Fin held effect transistor
- Patent Title (中): 鳍保持效应晶体管
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Application No.: US13859505Application Date: 2013-04-09
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Publication No.: US08809940B2Publication Date: 2014-08-19
- Inventor: Hung-Ta Lin , Chu-Yun Fu , Shin-Yeh Huang , Shu-Tine Yang , Hung-Ming Chen
- Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
- Applicant Address: TW
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW
- Agency: Lowe Hauptman & Ham, LLP
- Main IPC: H01L21/02
- IPC: H01L21/02

Abstract:
A FinFET is described, the FinFET includes a substrate including a top surface and a first insulation region and a second insulation region over the substrate top surface comprising tapered top surfaces. The FinFET further includes a fin of the substrate extending above the substrate top surface between the first and second insulation regions, wherein the fin includes a recessed portion having a top surface lower than the tapered top surfaces of the first and second insulation regions, wherein the fin includes a non-recessed portion having a top surface higher than the tapered top surfaces. The FinFET further includes a gate stack over the non-recessed portion of the fin.
Public/Granted literature
- US20130228865A1 FIN FIELD EFFECT TRANSISTOR Public/Granted day:2013-09-05
Information query
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