Invention Grant
- Patent Title: Nanowire FET and FinFET hybrid technology
- Patent Title (中): 纳米线FET和FinFET混合技术
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Application No.: US14050921Application Date: 2013-10-10
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Publication No.: US08809957B2Publication Date: 2014-08-19
- Inventor: Sarunya Bangsaruntip , Josephine B. Chang , Leland Chang , Jeffrey W. Sleight
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Michael J. Chang, LLC
- Agent Vazken Alexanian
- Main IPC: H01L27/12
- IPC: H01L27/12

Abstract:
Hybrid nanowire FET and FinFET devices and methods for fabrication thereof are provided. In one aspect, a method for fabricating a CMOS circuit having a nanowire FET and a finFET includes the following steps. A wafer is provided having an active layer over a BOX. A first region of the active layer is thinned. An organic planarizing layer is deposited on the active layer. Nanowires and pads are etched in the first region of the active layer using a first hardmask. The nanowires are suspended over the BOX. Fins are etched in the second region of the active layer using a second hardmask. A first gate stack is formed that surrounds at least a portion of each of the nanowires. A second gate stack is formed covering at least a portion of each of the fins. An epitaxial material is grown on exposed portions of the nanowires, pads and fins.
Public/Granted literature
- US20140027855A1 Nanowire FET and FINFET Hybrid Technology Public/Granted day:2014-01-30
Information query
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