Invention Grant
US08810010B2 Semiconductor device and method for fabricating the same 有权
半导体装置及其制造方法

  • Patent Title: Semiconductor device and method for fabricating the same
  • Patent Title (中): 半导体装置及其制造方法
  • Application No.: US13719099
    Application Date: 2012-12-18
  • Publication No.: US08810010B2
    Publication Date: 2014-08-19
  • Inventor: Jae Bum Kim
  • Applicant: SK hynix Inc.
  • Applicant Address: KR Icheon
  • Assignee: SK Hynix Inc.
  • Current Assignee: SK Hynix Inc.
  • Current Assignee Address: KR Icheon
  • Priority: KR10-2012-0095894 20120830
  • Main IPC: H01L29/06
  • IPC: H01L29/06 H01L23/48 H01L21/48
Semiconductor device and method for fabricating the same
Abstract:
An exemplary semiconductor device comprises a through silicon via penetrating a semiconductor substrate including a circuit pattern on one side of the substrate, a first doped layer formed in the other side, and a bump connected with the through silicon via.
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