Invention Grant
- Patent Title: Waveform detection and combined step and linear dim control
- Patent Title (中): 波形检测和组合步进和线性调光控制
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Application No.: US12934873Application Date: 2009-03-27
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Publication No.: US08810142B2Publication Date: 2014-08-19
- Inventor: Henricus T. P. J. Van Elk , Jeroen Kleinpenning
- Applicant: Henricus T. P. J. Van Elk , Jeroen Kleinpenning
- Applicant Address: NL Eindhoven
- Assignee: NXP B.V.
- Current Assignee: NXP B.V.
- Current Assignee Address: NL Eindhoven
- Priority: EP08103192 20080331
- International Application: PCT/IB2009/051289 WO 20090327
- International Announcement: WO2009/122334 WO 20091008
- Main IPC: H05B41/36
- IPC: H05B41/36 ; H03K17/00

Abstract:
The present invention relates to a detection circuit (100) capable to detect a rectified phase-cut or sinusoidal wave-form using its duty cycle or average value and in response, to select the respective dim mode amongst the linear phase-cut and step-dimming. The circuit (100) receives the rectified waveform with its duty cycle, which is derived through a comparator (22, 24) and converted into a DC signal. The latter which is controlled by the duty cycle is then compared to a reference level (40) through another comparator (20) that, in response, supplies a signal controlling a switching device (30). The switching device (30) will be thus automatically connected either to one set signal level when the DC signal is greater than the reference level (40), namely when the circuit (100) detects a rectified sinusoidal waveform, or to the same level as the DC signal when the DC signal is less than the reference level (40), namely when the circuit (100) detects a rectified phase-cut waveform.
Public/Granted literature
- US20110025228A1 WAVEFORM DETECTION AND COMBINED STEP AND LINEAR DIM CONTROL Public/Granted day:2011-02-03
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