Invention Grant
- Patent Title: Methods for detecting damage to magnetoresistive sensors
- Patent Title (中): 检测磁阻传感器损坏的方法
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Application No.: US13186341Application Date: 2011-07-19
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Publication No.: US08810241B2Publication Date: 2014-08-19
- Inventor: Icko E. Tim Iben , Darrell G. Follett , Guillermo Paniagua
- Applicant: Icko E. Tim Iben , Darrell G. Follett , Guillermo Paniagua
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Zilka-Kotab, PC
- Main IPC: G01R33/12
- IPC: G01R33/12

Abstract:
A system and method for detecting a damaged magnetoresistive sensor includes measuring a median DiffPN value of a group of GMR sensors on a module, the sensors characterized as having been deposited on a same wafer and having been lapped as a single unit; comparing the DiffPN values to the median; determining that physical and/or magnetic damage has occurred to an individual sensor if the difference in the DiffPN value of the individual sensor from the median is greater than a statistically predetermined value for the group of sensors; where the difference is at least one times the average of the standard deviations of a large number of normal modules or the average of the standard deviations of a large number of modules, wherein at least the largest and the smallest DiffPN value within the module is not included in the calculation of the module's standard deviation.
Public/Granted literature
- US20110276287A1 METHODS FOR DETECTING DAMAGE TO MAGNETORESISTIVE SENSORS Public/Granted day:2011-11-10
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