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US08811065B2 Performing error detection on DRAMs 有权
对DRAM执行错误检测

Performing error detection on DRAMs
Abstract:
Large capacity memory systems are constructed using multiple groups of memory integrated circuits or chips. The memory system includes one or more interface circuits for interfacing between the multiple groups of memory integrated circuits and a memory controller. The interface circuit may detect and/or recover failed data using error-checking information stored in a memory integrated circuit.
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