Invention Grant
- Patent Title: Performing error detection on DRAMs
- Patent Title (中): 对DRAM执行错误检测
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Application No.: US13620565Application Date: 2012-09-14
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Publication No.: US08811065B2Publication Date: 2014-08-19
- Inventor: Suresh Natarajan Rajan , Michael John Sebastian Smith , David T. Wang
- Applicant: Suresh Natarajan Rajan , Michael John Sebastian Smith , David T. Wang
- Applicant Address: US CA Mountain View
- Assignee: Google Inc.
- Current Assignee: Google Inc.
- Current Assignee Address: US CA Mountain View
- Agency: Fish & Richardson P.C.
- Main IPC: G11C11/24
- IPC: G11C11/24 ; G11C5/02 ; G11C11/4093 ; G11C7/10 ; G11C7/00

Abstract:
Large capacity memory systems are constructed using multiple groups of memory integrated circuits or chips. The memory system includes one or more interface circuits for interfacing between the multiple groups of memory integrated circuits and a memory controller. The interface circuit may detect and/or recover failed data using error-checking information stored in a memory integrated circuit.
Public/Granted literature
- US20130100746A1 METHODS AND APPARATUS OF STACKING DRAMS Public/Granted day:2013-04-25
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