Invention Grant
US08811463B2 Jitter measuring trigger generator, jitter measuring apparatus using the same, method of generating jitter measuring trigger, and method of measuring jitter
有权
抖动测量触发发生器,使用其的抖动测量装置,产生抖动测量触发的方法和测量抖动的方法
- Patent Title: Jitter measuring trigger generator, jitter measuring apparatus using the same, method of generating jitter measuring trigger, and method of measuring jitter
- Patent Title (中): 抖动测量触发发生器,使用其的抖动测量装置,产生抖动测量触发的方法和测量抖动的方法
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Application No.: US13752872Application Date: 2013-01-29
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Publication No.: US08811463B2Publication Date: 2014-08-19
- Inventor: Takashi Murakami , Hisashi Matsumoto
- Applicant: Anritsu Corporation
- Applicant Address: JP Atsugi-Shi
- Assignee: Anritsu Corporation
- Current Assignee: Anritsu Corporation
- Current Assignee Address: JP Atsugi-Shi
- Agency: Pearne & Gordon LLP
- Priority: JP2012-020978 20120202
- Main IPC: H04B3/46
- IPC: H04B3/46 ; H04B17/00 ; H04Q1/20 ; G01R31/317 ; H03B19/00 ; G01R29/02

Abstract:
A phase adjuster 2a receives a trigger clock synchronized with a data signal to be measured as input, and controls the phase of the trigger clock such that the trigger period of samples of the data signal to be measured becomes one sample per bit. An adjustable frequency divider 2b has a frequency division ratio which is set such that a trigger pulse is generated at the fixed timing of the waveform pattern of the data signal to be measured. An interleaving unit 4d uses a discrete value which is in prime relation to the measured pattern length of the data signal to be measured, and acquires data for the number of samples corresponding to the measured pattern length from a sampler 3 by the trigger pulse from the adjustable frequency divider 2b.
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