Invention Grant
US08813010B2 Timing analysis program, timing analysis apparatus, and timing analysis method
有权
时序分析程序，时序分析装置和时序分析方法
- Patent Title: Timing analysis program, timing analysis apparatus, and timing analysis method
- Patent Title (中): 时序分析程序，时序分析装置和时序分析方法
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Application No.: US13845470Application Date: 2013-03-18
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Publication No.: US08813010B2Publication Date: 2014-08-19
- Inventor: Yasuhiro Oda
- Applicant: Renesas Electronics Corporation
- Applicant Address: JP Kawasaki-shi, Kanagawa
- Assignee: Renesas Electronics Corporation
- Current Assignee: Renesas Electronics Corporation
- Current Assignee Address: JP Kawasaki-shi, Kanagawa
- Agency: McGinn IP Law Group, PLLC
- Priority: JP2012-091808 20120413
- Main IPC: G06F9/455
- IPC: G06F9/455 ; G06F17/50
Abstract:
A timing analysis program for performing analysis condition generation processing which generates a first analysis condition in which the variation width of a first delay value of a first circuit cell is shifted on the basis of a first variation coefficient and a second analysis condition in which the variation width of a second delay value of a second circuit cell is shifted on the basis of a second variation coefficient.
Public/Granted literature
- US20130275932A1 TIMING ANALYSIS PROGRAM, TIMING ANALYSIS APPARATUS, AND TIMING ANALYSIS METHOD Public/Granted day:2013-10-17
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