Invention Grant
- Patent Title: Substrate treatment method and substrate treatment apparatus
- Patent Title (中): 基板处理方法和基板处理装置
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Application No.: US13228034Application Date: 2011-09-08
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Publication No.: US08815111B2Publication Date: 2014-08-26
- Inventor: Kazuki Nakamura
- Applicant: Kazuki Nakamura
- Applicant Address: JP
- Assignee: Dainippon Screen Mfg. Co., Ltd.
- Current Assignee: Dainippon Screen Mfg. Co., Ltd.
- Current Assignee Address: JP
- Agency: Ostrolenk Faber LLP
- Priority: JP2010-217217 20100928
- Main IPC: B44C1/22
- IPC: B44C1/22

Abstract:
The substrate treatment method is for treating a substrate with a chemical liquid in a treatment chamber. The method includes a higher temperature chemical liquid supplying step, and a rinse liquid supplying step after the higher temperature chemical liquid supplying step. The rinse liquid supplying step includes: a peripheral edge portion treating step of supplying the rinse liquid selectively onto a center portion of the front surface of the substrate so that a chemical liquid treatment is inhibited on the center portion while being allowed to proceed on a peripheral edge portion of the front surface of the substrate; and an entire surface rinsing step of spreading the rinse liquid over the entire front surface of the substrate to replace the chemical liquid with the rinse liquid on the entire front surface of the substrate after the peripheral edge portion treating step.
Public/Granted literature
- US20120074101A1 SUBSTRATE TREATMENT METHOD AND SUBSTRATE TREATMENT APPARATUS Public/Granted day:2012-03-29
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