A method of forming interconnects in integrated circuits includes providing a semiconductor substrate and forming a copper interconnect structure that is formed overlying a barrier layer within a thickness of an interlayer dielectric layer. The copper interconnect structure has a first stress characteristic. The method further loads the semiconductor substrate including the copper interconnect structure into a deposition chamber that contains an inert environment. The semiconductor substrate including the copper interconnect structure is annealed in the inert environment for a period of time to cause the copper interconnect structure to have a second stress characteristic. The semiconductor substrate is maintained in the deposition chamber while an etch stop layer is deposited thereon. The method further deposits an intermetal dielectric layer overlying the etch stop layer, wherein the annealing reduces copper hillock defects resulting from at least the first stress characteristic.