Invention Grant
US08815663B2 Method of manufacturing thin film transistor, thin film transistor manufactured using the method, method of manufacturing organic light-emitting display apparatus, and organic light-emitting display apparatus manufactured using the method
有权
制造薄膜晶体管的方法,使用该方法制造的薄膜晶体管,制造有机发光显示装置的方法和使用该方法制造的有机发光显示装置
- Patent Title: Method of manufacturing thin film transistor, thin film transistor manufactured using the method, method of manufacturing organic light-emitting display apparatus, and organic light-emitting display apparatus manufactured using the method
- Patent Title (中): 制造薄膜晶体管的方法,使用该方法制造的薄膜晶体管,制造有机发光显示装置的方法和使用该方法制造的有机发光显示装置
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Application No.: US13313555Application Date: 2011-12-07
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Publication No.: US08815663B2Publication Date: 2014-08-26
- Inventor: Byoung-Keon Park , Jong-Ryuk Park , Tak-Young Lee , Jin-Wook Seo , Ki-Yong Lee
- Applicant: Byoung-Keon Park , Jong-Ryuk Park , Tak-Young Lee , Jin-Wook Seo , Ki-Yong Lee
- Applicant Address: KR Giheung-Gu, Yongin, Gyeonggi-Do
- Assignee: Samsung Display Co., Ltd.
- Current Assignee: Samsung Display Co., Ltd.
- Current Assignee Address: KR Giheung-Gu, Yongin, Gyeonggi-Do
- Agent Robert E. Bushnell, Esq.
- Priority: KR10-2011-0060231 20110621
- Main IPC: H01L29/786
- IPC: H01L29/786 ; H01L33/08 ; H01L33/16 ; H01L21/336

Abstract:
A method of manufacturing a TFT, including forming a buffer layer, an amorphous silicon layer, an insulating layer, and a first conductive layer on a substrate, forming a polycrystalline silicon layer by crystallizing the amorphous silicon layer, forming a semiconductor layer, a gate insulating layer, and a gate electrode that have a predetermined shape by simultaneously patterning the polycrystalline silicon layer, the insulating layer, and the first conductive layer, wherein the polycrystalline silicon layer is further etched to produce an undercut recessed a distance compared to sidewalls of the insulating layer and the first conductive layer, forming source and drain regions within the semiconductor layer by doping corresponding portions of the semiconductor layer, forming an interlayer insulating layer on the gate electrode, the interlayer insulating layer covering the gate insulating layer and forming source and drain electrodes that are electrically connected to source and drain regions respectively.
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