Invention Grant
US08816271B2 Device for emitting a first beam of high-energy photons and a second beam of lower-energy photons, and associated method and measuring unit
有权
用于发射第一光束的高能光子和第二光束的低能光子的装置，以及相关联的方法和测量单元
- Patent Title: Device for emitting a first beam of high-energy photons and a second beam of lower-energy photons, and associated method and measuring unit
- Patent Title (中): 用于发射第一光束的高能光子和第二光束的低能光子的装置，以及相关联的方法和测量单元
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Application No.: US13133962Application Date: 2009-12-07
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Publication No.: US08816271B2Publication Date: 2014-08-26
- Inventor: Damien Chazal , Pierre-Arnaud Foucher , Gérard Segeral
- Applicant: Damien Chazal , Pierre-Arnaud Foucher , Gérard Segeral
- Applicant Address: FR Roissy en France
- Assignee: Geoservices Equipements
- Current Assignee: Geoservices Equipements
- Current Assignee Address: FR Roissy en France
- Agent Cameron R. Sneddon
- Priority: FR0858549 20081212
- International Application: PCT/FR2009/052427 WO 20091207
- International Announcement: WO2010/066994 WO 20100617
- Main IPC: G01V5/08
- IPC: G01V5/08
Abstract:
This device comprises a single radioactive source (44), capable of creating an incident beam (120), and a target (48) placed opposite the source (44).The target (48) is capable of creating the second beam (130) by interacting with a first part of the incident beam (120), a second part of the incident beam (120) passing through the target (48) to form the first beam (124).
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