Invention Grant
US08816297B2 Microfabricated high-bandpass foucault aperture for electron microscopy
有权
用于电子显微镜的微型高带通福柯孔径
- Patent Title: Microfabricated high-bandpass foucault aperture for electron microscopy
- Patent Title (中): 用于电子显微镜的微型高带通福柯孔径
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Application No.: US13708521Application Date: 2012-12-07
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Publication No.: US08816297B2Publication Date: 2014-08-26
- Inventor: Robert Glaeser , Rossana Cambie , Jian Jin
- Applicant: The Regents of the University of California
- Applicant Address: US CA Oakland
- Assignee: The Regents of the University of California
- Current Assignee: The Regents of the University of California
- Current Assignee Address: US CA Oakland
- Agency: Lawrence Berkeley National Laboratory
- Main IPC: H01J3/14
- IPC: H01J3/14 ; H01J37/26

Abstract:
A variant of the Foucault (knife-edge) aperture is disclosed that is designed to provide single-sideband (SSB) contrast at low spatial frequencies but retain conventional double-sideband (DSB) contrast at high spatial frequencies in transmission electron microscopy. The aperture includes a plate with an inner open area, a support extending from the plate at an edge of the open area, a half-circle feature mounted on the support and located at the center of the aperture open area. The radius of the half-circle portion of reciprocal space that is blocked by the aperture can be varied to suit the needs of electron microscopy investigation. The aperture is fabricated from conductive material which is preferably non-oxidizing, such as gold, for example.
Public/Granted literature
- US20130099115A1 MICROFABRICATED HIGH-BANDPASS FOUCAULT APERTURE FOR ELECTRON MICROSCOPY Public/Granted day:2013-04-25
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