Invention Grant
- Patent Title: Method and device for detecting near-surface defects by means of magnetic leakage flux measurement
- Patent Title (中): 通过漏磁通量测量检测近表面缺陷的方法和装置
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Application No.: US12988167Application Date: 2009-03-25
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Publication No.: US08816681B2Publication Date: 2014-08-26
- Inventor: Heinrich Braun
- Applicant: Heinrich Braun
- Applicant Address: DE
- Assignee: Institut Dr. Foerster GmbH & Co. KG
- Current Assignee: Institut Dr. Foerster GmbH & Co. KG
- Current Assignee Address: DE
- Agency: DLA Piper LLP (US)
- Priority: DE102008020194 20080416
- International Application: PCT/EP2009/002153 WO 20090325
- International Announcement: WO2009/127316 WO 20091022
- Main IPC: G01N27/82
- IPC: G01N27/82 ; G01N27/87
Abstract:
In a method for detecting near-surface defects in a test sample consisting at least partly of a ferromagnetic material, a test volume of the test sample is magnetized and scanned for the detection of magnetic leakage fields caused by defects. The test volume is magnetized by means of a magnetic constant field and simultaneously by means of a magnetic alternating field superposed on the constant field. Leakage field test devices suitable for carrying out the method are described.
Public/Granted literature
- US20110037461A1 METHOD AND DEVICE FOR DETECTING NEAR-SURFACE DEFECTS BY MEANS OF MAGNETIC LEAKAGE FLUX MEASUREMENT Public/Granted day:2011-02-17
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