Invention Grant
- Patent Title: Testing apparatus and testing method for LCD
- Patent Title (中): LCD测试仪器及测试方法
-
Application No.: US12886906Application Date: 2010-09-21
-
Publication No.: US08816714B2Publication Date: 2014-08-26
- Inventor: Young Man Kwon , Sangjig Lee
- Applicant: Young Man Kwon , Sangjig Lee
- Applicant Address: CN Beijing
- Assignee: Beijing Boe Optoelectronics Technology Co., Ltd.
- Current Assignee: Beijing Boe Optoelectronics Technology Co., Ltd.
- Current Assignee Address: CN Beijing
- Agency: Ladas & Parry LLP
- Priority: CN200910093466 20090924; CN200910093488 20090924
- Main IPC: G01R31/26
- IPC: G01R31/26

Abstract:
The present technology discloses a testing apparatus and a testing method for liquid crystal display (LCD). The apparatus comprises a testing chamber, at least one support device in the testing chamber and an adjusting device. The support device comprises a support stage located at the bottom of the testing chamber and a support rail located on a side wall of the testing chamber. The LCD is supported by the support stage and the support rail. The adjusting device is used to control the support rail to adjust angle of the LCD relative to the support stage.
Public/Granted literature
- US20110068816A1 TESTING APPARATUS AND TESTING METHOD FOR LCD Public/Granted day:2011-03-24
Information query