Invention Grant
- Patent Title: Current detection circuit
- Patent Title (中): 电流检测电路
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Application No.: US13222232Application Date: 2011-08-31
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Publication No.: US08816722B2Publication Date: 2014-08-26
- Inventor: Tatsuji Nishijima
- Applicant: Tatsuji Nishijima
- Applicant Address: JP Kanagawa-ken
- Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee Address: JP Kanagawa-ken
- Agency: Nixon Peabody LLP
- Agent Jeffrey L. Costellia
- Priority: JP2010-203901 20100913
- Main IPC: H03D1/00
- IPC: H03D1/00 ; G01R19/00

Abstract:
An object is to widen detection range of current. A current detection circuit includes a first resistor, which is connected to a first connection terminal and a second connection terminal; a second resistor, which is connected to the first resistor; a third resistor, which is connected to the first resistor; a first transistor, a source of which is connected to the second resistor; a second transistor, a source of which is connected to the third resistor, and a drain and a gate of which is connected to a gate of the first transistor; a third transistor, a source of which is connected to the source of the second transistor, and a gate of which is connected to the drain of the first transistor; and a fourth resistor, which is connected to the drain of the third transistor, and to which a voltage is input.
Public/Granted literature
- US20120062240A1 CURRENT DETECTION CIRCUIT Public/Granted day:2012-03-15
Information query
IPC分类: