Invention Grant
- Patent Title: Adaptive memory calibration using bins
- Patent Title (中): 使用箱体进行自适应存储器校准
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Application No.: US11267627Application Date: 2005-11-04
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Publication No.: US08816742B2Publication Date: 2014-08-26
- Inventor: Jagrut Viliskumar Patel , Gregory Bullard , Sanat Kapoor
- Applicant: Jagrut Viliskumar Patel , Gregory Bullard , Sanat Kapoor
- Applicant Address: US CA San Diego
- Assignee: QUALCOMM Incorporated
- Current Assignee: QUALCOMM Incorporated
- Current Assignee Address: US CA San Diego
- Agent Peter Michael Kamarchik; Nicholas J. Pauley; Joseph Agusta
- Main IPC: H03H11/06
- IPC: H03H11/06

Abstract:
An electronic device comprises an electronic component and an integrated circuit, wherein the integrated circuit is configured to generate a system clock and an external clock having a programmable delay from the system clock, provide the external clock to the electronic component, determine a delay range between system clock and the external clock in which the integrated circuit and the electronic component can communicate, and program the external clock with one of a plurality of predetermined delay values based on the delay range.
Public/Granted literature
- US20080123444A1 Adaptive memory calibration using bins Public/Granted day:2008-05-29
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