Invention Grant
- Patent Title: Radar device, calibration system and calibration method
- Patent Title (中): 雷达装置,校准系统和校准方法
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Application No.: US13467589Application Date: 2012-05-09
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Publication No.: US08816900B2Publication Date: 2014-08-26
- Inventor: Yutaka Hasegawa , Koji Shimizu
- Applicant: Yutaka Hasegawa , Koji Shimizu
- Applicant Address: JP Kariya
- Assignee: Denso Corporation
- Current Assignee: Denso Corporation
- Current Assignee Address: JP Kariya
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: JP2011-110528 20110517
- Main IPC: G01S13/00
- IPC: G01S13/00 ; G01S7/40

Abstract:
In an environment inspection mode of a calibration system, a radar device executes a signal analysis process to calculate an eigenvalue ratio of each comparison eigenvalue. The eigenvalue ratio has a small value when a pair of eigenvalues corresponding to arrival radar waves has a strong correlation. On the other hand, the eigenvalue ratio has a large value when the eigenvalue ratio is calculated between an eigenvalue and thermal noise. When there is no eigenvalue which is not more than a reference threshold value, the radar device indicates a notice that the current environment is suitable for the calibration of the radar device. On the other hand, when there is presence of at least one eigenvalue of not more than the reference threshold value, the radar device indicates a notice that the current environment is unsuitable for the calibration of the radar device.
Public/Granted literature
- US20120293360A1 RADAR DEVICE, CALIBRATION SYSTEM AND CALIBRATION METHOD Public/Granted day:2012-11-22
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