Invention Grant
US08817226B2 Systems and methods for insitu lens cleaning using ozone in immersion lithography
有权
在浸没式光刻中使用臭氧进行透镜清洁的系统和方法
- Patent Title: Systems and methods for insitu lens cleaning using ozone in immersion lithography
- Patent Title (中): 在浸没式光刻中使用臭氧进行透镜清洁的系统和方法
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Application No.: US12128035Application Date: 2008-05-28
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Publication No.: US08817226B2Publication Date: 2014-08-26
- Inventor: Harry Sewell , Louis John Markoya
- Applicant: Harry Sewell , Louis John Markoya
- Applicant Address: NL Veldhoven
- Assignee: ASML Holding N.V.
- Current Assignee: ASML Holding N.V.
- Current Assignee Address: NL Veldhoven
- Agency: Pillsbury Winthrop Shaw Pittman LLP
- Priority: JP2008-28305 20080208
- Main IPC: G03B27/52
- IPC: G03B27/52 ; G03B27/54 ; G03B27/32 ; G03B27/58 ; G03B27/42

Abstract:
An immersion lithography apparatus is provided that includes an energy source, a projection optical system, a stage, a showerhead including an immersion liquid supply device and an immersion liquid discharge device that produces a flow of liquid within an exposure zone, and a cleaning device that cleans a portion of the projection optical system having been contacted with the immersion liquid by means of a cleaning gas. In an embodiment, the cleaning device includes an ozone generation unit produces a flow of ozone into the exposure zone. In embodiments, the apparatus includes a stage that includes a dose sensor and/or an ultra-violet light source. A method for insitu cleaning of a final lens element within an immersion lithography system having an immersion fluid showerhead that provides immersion fluid to an exposure zone of the immersion lithography system is also provided.
Public/Granted literature
- US20090109411A1 Systems and Methods for Insitu Lens Cleaning Using Ozone in Immersion Lithography Public/Granted day:2009-04-30
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