Invention Grant
- Patent Title: Fluorescence measurement device and fluorescence measurement method
- Patent Title (中): 荧光测量装置和荧光测量方法
-
Application No.: US13521684Application Date: 2011-01-13
-
Publication No.: US08817244B2Publication Date: 2014-08-26
- Inventor: Kazuteru Hoshishima , Shigeyuki Nakada
- Applicant: Kazuteru Hoshishima , Shigeyuki Nakada
- Applicant Address: JP Tokyo
- Assignee: Mitsui Engineering & Shipbuilding Co., Ltd.
- Current Assignee: Mitsui Engineering & Shipbuilding Co., Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Global IP Counselors, LLP
- Priority: JP2010-006406 20100115
- International Application: PCT/JP2011/000115 WO 20110113
- International Announcement: WO2011/086913 WO 20110721
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01N21/53 ; G01J3/02 ; G01N21/64 ; G01N15/14

Abstract:
Disclosed herein is a fluorescence measuring apparatus capable of more accurately measuring fluorescence emitted when an object to be measured is irradiated with laser light.The apparatus for measuring fluorescence emitted when an object to be measured is irradiated with laser light includes: a laser light source that irradiates the object to be measured with laser light; a first light-receiving unit that receives scattered light emitted when the object to be measured is irradiated with the laser light; a second light-receiving unit that receives fluorescence emitted when the object to be measured is irradiated with the laser light; and a signal processing unit that assigns a weight to a signal of the fluorescence received by the second light-receiving unit depending on an intensity of the scattered light received by the first light-receiving unit.
Public/Granted literature
- US20120281204A1 FLUORESCENCE MEASUREMENT DEVICE AND FLUORESCENCE MEASUREMENT METHOD Public/Granted day:2012-11-08
Information query