Invention Grant
- Patent Title: Precision approach path indicator measurement systems and methods
- Patent Title (中): 精密进近路径指示器测量系统和方法
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Application No.: US13612330Application Date: 2012-09-12
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Publication No.: US08817247B2Publication Date: 2014-08-26
- Inventor: Fazludeen Ruknudeen , Vivek Viswambharan , Shinu Gervasis
- Applicant: Fazludeen Ruknudeen , Vivek Viswambharan , Shinu Gervasis
- Applicant Address: US NJ Morristown
- Assignee: Honeywell International Inc.
- Current Assignee: Honeywell International Inc.
- Current Assignee Address: US NJ Morristown
- Agency: Brooks, Cameron & Huebsch, PLLC
- Main IPC: G01B11/26
- IPC: G01B11/26

Abstract:
Precision approach path indicator (PAPI) measurement systems and methods are described herein. One system includes a number of light sensor modules, wherein each light sensor module is configured to determine an intensity of a beam of light from a PAPI unit, a memory, and a processor configured to execute executable instructions stored in the memory to determine a transition angle of the beam of light from the PAPI unit, an elevation angle of the beam of light with respect to horizontal, and a width of a transition region of the beam of light, based, at least in part, on the intensity of the beam of light determined by each light sensor module.
Public/Granted literature
- US20140071441A1 PRECISION APPROACH PATH INDICATOR MEASUREMENT SYSTEMS AND METHODS Public/Granted day:2014-03-13
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