Invention Grant
US08818073B2 Display panel test apparatus and method of testing a display panel using the same
有权
显示面板测试装置和使用其的显示面板的测试方法
- Patent Title: Display panel test apparatus and method of testing a display panel using the same
- Patent Title (中): 显示面板测试装置和使用其的显示面板的测试方法
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Application No.: US12976476Application Date: 2010-12-22
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Publication No.: US08818073B2Publication Date: 2014-08-26
- Inventor: Bum-Suk Lee , Eung-Sang Lee , Gi-Chang Park , Jong-Jin Kim , Chan-Youn Park
- Applicant: Bum-Suk Lee , Eung-Sang Lee , Gi-Chang Park , Jong-Jin Kim , Chan-Youn Park
- Applicant Address: KR
- Assignee: Samsung Display Co., Ltd.
- Current Assignee: Samsung Display Co., Ltd.
- Current Assignee Address: KR
- Agency: Cantor Colburn LLP
- Priority: KR10-2010-0073420 20100729
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G09G3/00 ; G09G3/36

Abstract:
A display panel test apparatus includes: an image pickup part which picks up an image from a target display panel; a jig including a receiving part which receives the target display panel, a fixing part which fixes the image pickup part, and an adjusting part which adjusts an image pickup angle of the image pickup part; a pattern generating part which provides the target display panel with a test pattern; a defect extracting part which analyzes test image data provided from the image pickup part using a defect extracting algorithm and extracts display defect information, where the defect extracting algorithm includes different settings corresponding to different types of display defects; and a control part which generates evaluated data corresponding to a viewing angle of the target display panel using the image pickup angle of the image pickup part and the display defect information.
Public/Granted literature
- US20120026315A1 DISPLAY PANEL TEST APPARATUS AND METHOD OF TESTING A DISPLAY PANEL USING THE SAME Public/Granted day:2012-02-02
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