Invention Grant
- Patent Title: Test and measurement instrument and method of switching waveform display styles
- Patent Title (中): 测试和测量仪器以及开关波形显示方式
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Application No.: US12491999Application Date: 2009-06-25
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Publication No.: US08818744B2Publication Date: 2014-08-26
- Inventor: Gregory A. Martin , David D. Farrell , Evan A. Dickinson
- Applicant: Gregory A. Martin , David D. Farrell , Evan A. Dickinson
- Applicant Address: US OR Beaverton
- Assignee: Tektronix, Inc.
- Current Assignee: Tektronix, Inc.
- Current Assignee Address: US OR Beaverton
- Agency: Marger Johnson & McCollom PC
- Agent Thomas F. Lenihan
- Main IPC: G01R13/02
- IPC: G01R13/02

Abstract:
A test and measurement instrument and method of switching waveform display styles includes acquiring an electrical signal, storing peak detect data samples from the electrical signal to one or more memory devices, storing filtered data samples or unfiltered data from the electrical signal, automatically switching to a first waveform display style having the peak detect data samples configured in a first mode when a user selects the unfiltered data, and automatically switching to a second waveform display style having the peak detect data samples configured in a second mode when the user selects the filtered data samples.
Public/Granted literature
- US20100100346A1 Test and Measurement Instrument and Method of Switching Waveform Display Styles Public/Granted day:2010-04-22
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