Invention Grant
- Patent Title: Circuits and methods for generating a self-test of a magnetic field sensor
- Patent Title (中): 用于产生磁场传感器自检的电路和方法
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Application No.: US13743451Application Date: 2013-01-17
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Publication No.: US08818749B2Publication Date: 2014-08-26
- Inventor: Andreas P. Friedrich , Andrea Foletto , Michael C. Doogue , William P. Taylor , Ravi Vig , P. Karl Scheller
- Applicant: Allegro Microsystems, LLC
- Applicant Address: US MA Worcester
- Assignee: Allegro Microsystems, LLC
- Current Assignee: Allegro Microsystems, LLC
- Current Assignee Address: US MA Worcester
- Agency: Daly, Crowley, Mofford & Durkee, LLP
- Main IPC: G01R27/28
- IPC: G01R27/28 ; G01R33/00 ; G01R35/00
Abstract:
A magnetic field sensor includes built in self-test circuits that allow a self-test of most of, or all of, the circuitry of the magnetic field sensor, including self-test of a magnetic field sensing element used within the magnetic field sensor, while the magnetic field sensor is functioning in normal operation.
Public/Granted literature
- US20130134965A1 Circuits and Methods for Generating a Self-Test of a Magnetic Field Sensor Public/Granted day:2013-05-30
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